@misc{6a73e79c918f4f05ab33cf6d316830f0,
title = "Failure Analysis to Identify Thermal Runaway of Bypass Diodes in Fielded Modules",
abstract = "We studied a bypass diode recuperated from fielded modules in a rooftop installation to determine the failure mechanism. The field-failed diode showed similar characteristics to thermal runaway, specifically X-ray tomography evidence of migrated metal. We also observed burn marks on the silicon surface like those lab-stressed for thermal runaway. Reaction products are more soluble than silicon and the surface is oxygen rich.",
keywords = "bypass diode, failure analysis, fielded module, thermal imaging, X-ray tomography",
author = "Chuanxiao Xiao and Steven Johnston and Peter Hacke and Mowafak Al-Jassim and Yasunori Uchida",
year = "2017",
language = "American English",
series = "Presented at the 2017 Photovoltaic Module Reliability Workshop, 28 February - 2 March 2017, Lakewood, Colorado",
type = "Other",
}