Abstract
Czochralski (CZ) and float-zone (FZ) crystals were grown from experimental solar-grade silicon (SoG-Si) feedstock materials developed by Crystal Systems. The materials were metallurgical-grade Si and highly boron-doped p-type electronic-grade Si (EG-Si) reject material, both of which were gaseous melt-treated to remove boron. Crystal growth observations, lifetime and impurity characterization of the grown crystals, and device performance of wafers from them are presented. Devices made directly on treated high-B EG-Si feedstock have a little over half the efficiency of devices made from control CZ samples. However, devices on CZ and FZ crystals grown from the treated high-B EG-Si feedstock have comparable PV performance (14.0% and 13.8% efficiency, respectively) to that of CZ control samples (14.1%).
Original language | American English |
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Pages | 210-213 |
Number of pages | 4 |
DOIs | |
State | Published - 2002 |
Event | Twenty-Ninth IEEE Photovoltaic Specialists Conference 2002 - New Orleans, Louisiana Duration: 19 May 2002 → 24 May 2002 |
Conference
Conference | Twenty-Ninth IEEE Photovoltaic Specialists Conference 2002 |
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City | New Orleans, Louisiana |
Period | 19/05/02 → 24/05/02 |
Bibliographical note
For preprint version including full text online document, see NREL/CP-520-31442NREL Publication Number
- NREL/CP-520-33689