Abstract
The evolution of the RHEED pattern during the formation of InAs/GaAs QDs was followed. Data show that InAs epilayers can evolve during quenching from growth temperature and may have implications on the accuracy of measurements of the shapes and sizes of quantum dots formed at growth temperature.
Original language | American English |
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Pages (from-to) | 1489-1492 |
Number of pages | 4 |
Journal | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures |
Volume | 20 |
Issue number | 4 |
DOIs | |
State | Published - 2002 |
Event | Proceedings of the 29th Conference on the Physics and Chemistry of Semiconductor Interfaces - Santa Fe, NM, United States Duration: 6 Jan 2002 → 10 Jan 2002 |
NREL Publication Number
- NREL/JA-520-33330