Abstract
We study the performance of CdS/CdTe thin-film devices contacted with ZnTe:Cu/Ti of various thickness at a higher-than-optimum temperature of~360..deg..C. At this temperature, optimum device performance requires the same thickness of ZnTe:Cu as for similar contacts formed at a lower temperature of 320..deg..C. C-V analysis indicates that a ZnTe:Cu layer thickness of <~0.5 ..mu..m does not yieldthe degree of CdTe net acceptor concentration necessary to reduce space charge width to its optimum value for n-p device operation. The thickest ZnTe:Cu layer investigated (1 ..mu..m) yields the highest CdTe net acceptor concentration, lowest value of Jo, and highest Voc. However, performance is limited for this device by poor fill factor. We suggest poor fill factor is due to Cu-relatedacceptors compensating donors in CdS.
| Original language | American English |
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| Number of pages | 6 |
| State | Published - 2006 |
| Event | 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion (WCPEC-4) - Waikoloa, Hawaii Duration: 7 May 2006 → 12 May 2006 |
Conference
| Conference | 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion (WCPEC-4) |
|---|---|
| City | Waikoloa, Hawaii |
| Period | 7/05/06 → 12/05/06 |
NREL Publication Number
- NREL/CP-520-39804
Keywords
- contacts
- devices
- ion-beam milled
- net acceptor concentration
- PV
- thin films