@misc{ab84e2e2d87a4872a489d97158b94c52,
title = "From Data to Discovery: AI's Transformative Role in Thin Film Research",
abstract = "The advancement of thin film technologies is pivotal for progress in numerous fields, including energy, electronics, and quantum computing. However, the traditional trial-and-error approach to materials discovery is inherently slow and inefficient. This presentation will showcase how artificial intelligence (AI) is transforming thin film research by enabling a data-driven paradigm shift. We will highlight our past successes in applying AI to understand radiation damage in thin film oxides, demonstrating how graph analytics can unravel complex material behavior. Additionally, we will provide insights into our current work at the National Renewable Energy Laboratory, where we are leading the charge in autonomous materials science. Backed by a \$14M investment in our characterization facility, we are developing AI-guided workflows that seamlessly integrate experimentation and AI-guided decision-making. By harnessing the power of AI, we aim to accelerate the discovery and design of high-performance thin films, propelling innovation across a multitude of industries.",
keywords = "artificial intelligence, machine learning, materials science, microscopy, radiation effects, thin films",
author = "Steven Spurgeon",
year = "2025",
language = "American English",
series = "Presented at Electronic Materials and Applications (EMA) 2025, 25-28 February 2025, Denver, Colorado",
type = "Other",
}