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FT-PL Analysis of CIGS/CdS/ZnO Interfaces
NREL
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Dive into the research topics of 'FT-PL Analysis of CIGS/CdS/ZnO Interfaces'. Together they form a unique fingerprint.
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Material Science
Photoluminescence
100%
Gallium
100%
Indium
100%
ZnO
100%
Film
50%
Buffer Layer
16%
Surface Analysis
16%
Physics
Indium
100%
Photoluminescence
100%
Helium-Neon Laser
16%
Cryostat
16%
Ellipsometry
16%
Engineering
Fourier Transform
100%
Device Performance
25%
Laser Excitation
25%
Excitation Source
25%
Radiative Recombination
25%
Buffer Layer
25%