FTIR and FT-PL Spectroscopic Analysis of TPV Materials and Devices

Research output: Contribution to conferencePaper

Abstract

Fourier transform (FT) spectroscopic techniques are useful in determining properties of thermophotovoltaic (TPV) materials and devices. The III-V TPV absorber materials have energy bandgaps that can be optimized for conversion of the near-infrared radiation emitted by thermal sources in the 1000-2000 deg. C temperature range. The bandgaps of these materials can be measured at room temperatureusing FT-photoluminescence spectroscopy, which can be done with a modified FT-Raman spectrophotometer operating in the near-infrared spectral region. The intensities and bandwidths of the FT-PL spectra also provide information on the extent of non-radiative recombination and the compositional uniformity of the materials. To achieve adequate operating efficiencies, TPV converters must returnsub-bandgap radiation to the thermal source. The percent reflectance of the device in the mid-infrared spectral region is therefore an important operating parameter that can be accurately measured using FT-infrared (FTIR) spectroscopy with total reflectance optical accessories. In this paper, we discuss applications of these techniques to TPV materials and devices, and variations on theseapproaches.
Original languageAmerican English
Number of pages15
StatePublished - 1998
Event4th NREL Conference on Thermophotovoltaic Generation of Electricity - Denver, Colorado
Duration: 11 Oct 199814 Oct 1998

Conference

Conference4th NREL Conference on Thermophotovoltaic Generation of Electricity
CityDenver, Colorado
Period11/10/9814/10/98

NREL Publication Number

  • NREL/CP-520-25347

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