FTIR, EPMA, Auger, and XPS Analysis of Impurity Precipitates in CdS Films

Mowafak Al-Jassim

FTIR, EPMA, Auger, and XPS Analysis of Impurity Precipitates in CdS Films

Materials, Chemical, and Computational Science

Research output: Contribution to conference › Paper

Abstract

Impurities in cadmium sulfide (CdS) films are a concern in the fabrication of copper (indium, gallium) diselenide (CIGS) and cadmium telluride (CdTe) photovoltaic devices. Films of CdS grown using chemical bath deposition (CBD) generally yield better devices than purer CdS films grown using vacuum deposition techniques, despite the higher impurity concentrations typically observed in the CBD CdSfilms. In this work, we present Fourier transform infrared (FTIR), Auger, electron microprobe (EPMA), X-ray photoelectron spectroscopic (XPS), and secondary ion mass spectroscopic (SIMS) analyses of the impurities in CBD CdS films, and show that these differ as a function of substrate type and film deposition conditions. We also show that some of these impurities exist as 102 micron-scaleprecipitates.

Original language	American English
Number of pages	5
State	Published - 1997
Event	26th IEEE Photovoltaic Specialists Conference - Anaheim, California Duration: 29 Sep 1997 → 3 Oct 1997

Conference

Conference	26th IEEE Photovoltaic Specialists Conference
City	Anaheim, California
Period	29/09/97 → 3/10/97

Bibliographical note

Available electronically only

NREL Publication Number

NREL/CP-530-22966

Keywords

cadmium sulfide solar cells films
cadmium telluride (CdTe) photovoltaic solar cells modules
CdS films
copper diselenide
photovoltaic
solar

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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https://www.nrel.gov/docs/legosti/old/22966.pdf

Cite this

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title = "FTIR, EPMA, Auger, and XPS Analysis of Impurity Precipitates in CdS Films",

abstract = "Impurities in cadmium sulfide (CdS) films are a concern in the fabrication of copper (indium, gallium) diselenide (CIGS) and cadmium telluride (CdTe) photovoltaic devices. Films of CdS grown using chemical bath deposition (CBD) generally yield better devices than purer CdS films grown using vacuum deposition techniques, despite the higher impurity concentrations typically observed in the CBD CdSfilms. In this work, we present Fourier transform infrared (FTIR), Auger, electron microprobe (EPMA), X-ray photoelectron spectroscopic (XPS), and secondary ion mass spectroscopic (SIMS) analyses of the impurities in CBD CdS films, and show that these differ as a function of substrate type and film deposition conditions. We also show that some of these impurities exist as 102 micron-scaleprecipitates.",

keywords = "cadmium sulfide solar cells films, cadmium telluride (CdTe) photovoltaic solar cells modules, CdS films, copper diselenide, photovoltaic, solar",

author = "Mowafak Al-Jassim",

note = "Available electronically only; 26th IEEE Photovoltaic Specialists Conference ; Conference date: 29-09-1997 Through 03-10-1997",

year = "1997",

language = "American English",

}

TY - CONF

T1 - FTIR, EPMA, Auger, and XPS Analysis of Impurity Precipitates in CdS Films

AU - Al-Jassim, Mowafak

N1 - Available electronically only

PY - 1997

Y1 - 1997

N2 - Impurities in cadmium sulfide (CdS) films are a concern in the fabrication of copper (indium, gallium) diselenide (CIGS) and cadmium telluride (CdTe) photovoltaic devices. Films of CdS grown using chemical bath deposition (CBD) generally yield better devices than purer CdS films grown using vacuum deposition techniques, despite the higher impurity concentrations typically observed in the CBD CdSfilms. In this work, we present Fourier transform infrared (FTIR), Auger, electron microprobe (EPMA), X-ray photoelectron spectroscopic (XPS), and secondary ion mass spectroscopic (SIMS) analyses of the impurities in CBD CdS films, and show that these differ as a function of substrate type and film deposition conditions. We also show that some of these impurities exist as 102 micron-scaleprecipitates.

AB - Impurities in cadmium sulfide (CdS) films are a concern in the fabrication of copper (indium, gallium) diselenide (CIGS) and cadmium telluride (CdTe) photovoltaic devices. Films of CdS grown using chemical bath deposition (CBD) generally yield better devices than purer CdS films grown using vacuum deposition techniques, despite the higher impurity concentrations typically observed in the CBD CdSfilms. In this work, we present Fourier transform infrared (FTIR), Auger, electron microprobe (EPMA), X-ray photoelectron spectroscopic (XPS), and secondary ion mass spectroscopic (SIMS) analyses of the impurities in CBD CdS films, and show that these differ as a function of substrate type and film deposition conditions. We also show that some of these impurities exist as 102 micron-scaleprecipitates.

KW - cadmium sulfide solar cells films

KW - cadmium telluride (CdTe) photovoltaic solar cells modules

KW - CdS films

KW - copper diselenide

KW - photovoltaic

KW - solar

M3 - Paper

T2 - 26th IEEE Photovoltaic Specialists Conference

Y2 - 29 September 1997 through 3 October 1997

ER -

FTIR, EPMA, Auger, and XPS Analysis of Impurity Precipitates in CdS Films

Abstract

Conference

Bibliographical note

NREL Publication Number

Keywords

UN SDGs

Access to Document

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