FTIR, EPMA, Auger, and XPS Analysis of Impurity Precipitates in CdS Films

    Research output: Contribution to conferencePaper


    Impurities in cadmium sulfide (CdS) films are a concern in the fabrication of copper (indium, gallium) diselenide (CIGS) and cadmium telluride (CdTe) photovoltaic devices. Films of CdS grown using chemical bath deposition (CBD) generally yield better devices than purer CdS films grown using vacuum deposition techniques, despite the higher impurity concentrations typically observed in the CBD CdSfilms. In this work, we present Fourier transform infrared (FTIR), Auger, electron microprobe (EPMA), X-ray photoelectron spectroscopic (XPS), and secondary ion mass spectroscopic (SIMS) analyses of the impurities in CBD CdS films, and show that these differ as a function of substrate type and film deposition conditions. We also show that some of these impurities exist as 102 micron-scaleprecipitates.
    Original languageAmerican English
    Number of pages4
    StatePublished - 1997
    EventTwenty Sixth IEEE Photovoltaic Specialists Conference - Anaheim, California
    Duration: 29 Sep 19973 Oct 1997


    ConferenceTwenty Sixth IEEE Photovoltaic Specialists Conference
    CityAnaheim, California

    Bibliographical note

    For preprint version, including full text online document, see NREL/CP-530-22966

    NREL Publication Number

    • NREL/CP-520-25055


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