FTIR, EPMA, Auger, and XPS Analysis of Impurity Precipitates in CdS Films

doi:10.1109/PVSC.1997.654112

FTIR, EPMA, Auger, and XPS Analysis of Impurity Precipitates in CdS Films

Research output: Contribution to conference › Paper

Abstract

Impurities in cadmium sulfide (CdS) films are a concern in the fabrication of copper (indium, gallium) diselenide (CIGS) and cadmium telluride (CdTe) photovoltaic devices. Films of CdS grown using chemical bath deposition (CBD) generally yield better devices than purer CdS films grown using vacuum deposition techniques, despite the higher impurity concentrations typically observed in the CBD CdSfilms. In this work, we present Fourier transform infrared (FTIR), Auger, electron microprobe (EPMA), X-ray photoelectron spectroscopic (XPS), and secondary ion mass spectroscopic (SIMS) analyses of the impurities in CBD CdS films, and show that these differ as a function of substrate type and film deposition conditions. We also show that some of these impurities exist as 102 micron-scaleprecipitates.

Original language	American English
Pages	399-402
Number of pages	4
DOIs	https://doi.org/10.1109/PVSC.1997.654112
State	Published - 1997
Event	Twenty Sixth IEEE Photovoltaic Specialists Conference - Anaheim, California Duration: 29 Sep 1997 → 3 Oct 1997

Conference

Conference	Twenty Sixth IEEE Photovoltaic Specialists Conference
City	Anaheim, California
Period	29/09/97 → 3/10/97

Bibliographical note

For preprint version, including full text online document, see NREL/CP-530-22966

NREL Publication Number

NREL/CP-520-25055

Access to Document

10.1109/PVSC.1997.654112

Cite this

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title = "FTIR, EPMA, Auger, and XPS Analysis of Impurity Precipitates in CdS Films",

abstract = "Impurities in cadmium sulfide (CdS) films are a concern in the fabrication of copper (indium, gallium) diselenide (CIGS) and cadmium telluride (CdTe) photovoltaic devices. Films of CdS grown using chemical bath deposition (CBD) generally yield better devices than purer CdS films grown using vacuum deposition techniques, despite the higher impurity concentrations typically observed in the CBD CdSfilms. In this work, we present Fourier transform infrared (FTIR), Auger, electron microprobe (EPMA), X-ray photoelectron spectroscopic (XPS), and secondary ion mass spectroscopic (SIMS) analyses of the impurities in CBD CdS films, and show that these differ as a function of substrate type and film deposition conditions. We also show that some of these impurities exist as 102 micron-scaleprecipitates.",

author = "NREL",

note = "For preprint version, including full text online document, see NREL/CP-530-22966; Twenty Sixth IEEE Photovoltaic Specialists Conference ; Conference date: 29-09-1997 Through 03-10-1997",

year = "1997",

doi = "10.1109/PVSC.1997.654112",

language = "American English",

pages = "399--402",

}

TY - CONF

T1 - FTIR, EPMA, Auger, and XPS Analysis of Impurity Precipitates in CdS Films

AU - NREL, null

N1 - For preprint version, including full text online document, see NREL/CP-530-22966

PY - 1997

Y1 - 1997

N2 - Impurities in cadmium sulfide (CdS) films are a concern in the fabrication of copper (indium, gallium) diselenide (CIGS) and cadmium telluride (CdTe) photovoltaic devices. Films of CdS grown using chemical bath deposition (CBD) generally yield better devices than purer CdS films grown using vacuum deposition techniques, despite the higher impurity concentrations typically observed in the CBD CdSfilms. In this work, we present Fourier transform infrared (FTIR), Auger, electron microprobe (EPMA), X-ray photoelectron spectroscopic (XPS), and secondary ion mass spectroscopic (SIMS) analyses of the impurities in CBD CdS films, and show that these differ as a function of substrate type and film deposition conditions. We also show that some of these impurities exist as 102 micron-scaleprecipitates.

AB - Impurities in cadmium sulfide (CdS) films are a concern in the fabrication of copper (indium, gallium) diselenide (CIGS) and cadmium telluride (CdTe) photovoltaic devices. Films of CdS grown using chemical bath deposition (CBD) generally yield better devices than purer CdS films grown using vacuum deposition techniques, despite the higher impurity concentrations typically observed in the CBD CdSfilms. In this work, we present Fourier transform infrared (FTIR), Auger, electron microprobe (EPMA), X-ray photoelectron spectroscopic (XPS), and secondary ion mass spectroscopic (SIMS) analyses of the impurities in CBD CdS films, and show that these differ as a function of substrate type and film deposition conditions. We also show that some of these impurities exist as 102 micron-scaleprecipitates.

U2 - 10.1109/PVSC.1997.654112

DO - 10.1109/PVSC.1997.654112

M3 - Paper

SP - 399

EP - 402

T2 - Twenty Sixth IEEE Photovoltaic Specialists Conference

Y2 - 29 September 1997 through 3 October 1997

ER -

FTIR, EPMA, Auger, and XPS Analysis of Impurity Precipitates in CdS Films

Abstract

Conference

Bibliographical note

NREL Publication Number

Access to Document

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Cite this