General Mobility and Carrier Concentration Relationship in Transparent Amorphous Indium Zinc Oxide Films

Andrew J. Leenheer, John D. Perkins, Maikel F.A.M. Van Hest, Joseph J. Berry, Ryan P. O'Hayre, David S. Ginley

Research output: Contribution to journalArticlepeer-review

228 Scopus Citations

Abstract

We report the dependence of the electronic properties on the metal composition and oxygen content of transparent conducting amorphous indium zinc oxide (a-IZO) films deposited by dc magnetron sputtering. a-IZO shows a clear Burstein-Moss shift with an effective optical band gap of 3.1 eV independent of the metal composition. A metal-composition-independent dependence of the mobility (μ) on carrier concentration (N) is also found for a-IZO with μmax =54 cm2 V s at N=1.3× 1020 cm-3. The electron transport, thermally activated at N≤ 1019 cm-3, becomes limited by lattice scattering at N ≈ 1020 cm-3 and then by ionized impurity scattering at N>5× 1020 cm-3.

Original languageAmerican English
Article numberArticle No. 115215
Number of pages5
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume77
Issue number11
DOIs
StatePublished - 28 Mar 2008

NREL Publication Number

  • NREL/JA-520-43407

Keywords

  • optical properties
  • sputtering
  • transparent conductor

Fingerprint

Dive into the research topics of 'General Mobility and Carrier Concentration Relationship in Transparent Amorphous Indium Zinc Oxide Films'. Together they form a unique fingerprint.

Cite this