Grazing Incidence Cross-Sectioning of Thin-Film Solar Cells via Cryogenic Focused Ion Beam: A Case Study on CIGSe

Miguel Contreras, Kasra Sardashti, Richard Haight, Ryan Anderson, Bernd Fruhberger, Andrew Kummel

Research output: Contribution to journalArticlepeer-review

10 Scopus Citations

Abstract

Cryogenic focused ion beam (Cryo-FIB) milling at near-grazing angles is employed to fabricate cross-sections on thin Cu(In,Ga)Se2 with >8x expansion in thickness. Kelvin probe force microscopy (KPFM) on sloped cross sections showed reduction in grain boundaries potential deeper into the film. Cryo Fib-KPFM enabled the first determination of the electronic structure of the Mo/CIGSe back contact, where a sub 100 nm thick MoSey assists hole extraction due to 45 meV higher work function. This demonstrates that CryoFIB-KPFM combination can reveal new targets of opportunity for improvement in thin-films photovoltaics such as high-work-function contacts to facilitate hole extraction through the back interface of CIGS.
Original languageAmerican English
Pages (from-to)14994-14999
Number of pages6
JournalACS Applied Materials and Interfaces
Volume8
Issue number24
DOIs
StatePublished - 2016

NREL Publication Number

  • NREL/JA-5K00-66733

Keywords

  • back contacts
  • CIGSe
  • Cryo-FIB
  • KPFM
  • thin-film photovoltaics

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