Harmful Shunting Mechanisms Found in Silicon Solar Cells (Fact Sheet)

Harmful Shunting Mechanisms Found in Silicon Solar Cells (Fact Sheet)

Research output: NREL › Fact Sheet

Abstract

Scientists developed near-field optical microscopy for imaging electrical breakdown in solar cells and identified critical electrical breakdown mechanisms operating in industrial silicon and epitaxial silicon solar cells.

Original language	American English
State	Published - 2011

NREL Publication Number

NREL/FS-5200-51411

Keywords

PV
silicon
solar cells

Access to Document

https://www.nrel.gov/docs/fy11osti/51411.pdf

Cite this

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title = "Harmful Shunting Mechanisms Found in Silicon Solar Cells (Fact Sheet)",

abstract = "Scientists developed near-field optical microscopy for imaging electrical breakdown in solar cells and identified critical electrical breakdown mechanisms operating in industrial silicon and epitaxial silicon solar cells.",

keywords = "PV, silicon, solar cells",

author = "NREL",

year = "2011",

language = "American English",

type = "Other",

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T1 - Harmful Shunting Mechanisms Found in Silicon Solar Cells (Fact Sheet)

AU - NREL, null

PY - 2011

Y1 - 2011

N2 - Scientists developed near-field optical microscopy for imaging electrical breakdown in solar cells and identified critical electrical breakdown mechanisms operating in industrial silicon and epitaxial silicon solar cells.

AB - Scientists developed near-field optical microscopy for imaging electrical breakdown in solar cells and identified critical electrical breakdown mechanisms operating in industrial silicon and epitaxial silicon solar cells.

KW - PV

KW - silicon

KW - solar cells

M3 - Fact Sheet

ER -

Harmful Shunting Mechanisms Found in Silicon Solar Cells (Fact Sheet)

Abstract

NREL Publication Number

Keywords

Access to Document

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Cite this