Abstract
The authors demonstrate a thin, Ge-free III-V semiconductor triple-junction solar cell device structure that achieved 33.8%, 30.6%, and 38.9% efficiencies under the standard 1 sun global spectrum, space spectrum, and concentrated direct spectrum at 81 suns, respectively. The device consists of 1.8 eV Ga0.5 In0.5 P, 1.4 eV GaAs, and 1.0 eV In0.3 Ga0.7 As p-n junctions grown monolithically in an inverted configuration on GaAs substrates by organometallic vapor phase epitaxy. The lattice-mismatched In0.3 Ga0.7 As junction was grown last on a graded Gax In1-x P buffer. The substrate was removed after the structure was mounted to a structural "handle." The current-matched, series-connected junctions produced a total open-circuit voltage over 2.95 V at 1 sun.
Original language | American English |
---|---|
Article number | 023502 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 91 |
Issue number | 2 |
DOIs | |
State | Published - 2007 |
NREL Publication Number
- NREL/JA-520-41602
Keywords
- dislocations
- electric measurements
- elemental semiconductors
- epitaxy
- germanium
- III-V semiconductors
- lattice constants
- semiconductor growth
- semiconductor junctions
- solar cells