High-Resolution AES Mapping and TEM Study of Cu(In,Ga)Se2 Thin Film Growth: Preprint

Research output: Contribution to conferencePaper

Abstract

Presented at 2001 NCPV Program Review Meeting: TEM and high-resolution AES mapping data on CIGS samples.
Original languageAmerican English
Number of pages4
StatePublished - 2001
EventNCPV Program Review Meeting - Lakewood, Colorado
Duration: 14 Oct 200117 Oct 2001

Conference

ConferenceNCPV Program Review Meeting
CityLakewood, Colorado
Period14/10/0117/10/01

NREL Publication Number

  • NREL/CP-520-31004

Keywords

  • aes mapping
  • NCPV
  • photovoltaics (PV)
  • PV
  • TEM
  • thin films

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