High-Resolution AES Mapping and TEM Study of Cu(In,Ga)Se2 Thin Film Growth: Preprint

Research output: Contribution to conference › Paper

Abstract

Presented at 2001 NCPV Program Review Meeting: TEM and high-resolution AES mapping data on CIGS samples.

Original language	American English
Number of pages	4
State	Published - 2001
Event	NCPV Program Review Meeting - Lakewood, Colorado Duration: 14 Oct 2001 → 17 Oct 2001

@conference{4c472d1eada8497f9a7ca2e32eb3d8ea,

title = "High-Resolution AES Mapping and TEM Study of Cu(In,Ga)Se2 Thin Film Growth: Preprint",

abstract = "Presented at 2001 NCPV Program Review Meeting: TEM and high-resolution AES mapping data on CIGS samples.",

keywords = "aes mapping, NCPV, photovoltaics (PV), PV, TEM, thin films",

author = "NREL",

year = "2001",

language = "American English",

note = "NCPV Program Review Meeting ; Conference date: 14-10-2001 Through 17-10-2001",

}

TY - CONF

T1 - High-Resolution AES Mapping and TEM Study of Cu(In,Ga)Se2 Thin Film Growth: Preprint

AU - NREL, null

PY - 2001

Y1 - 2001

N2 - Presented at 2001 NCPV Program Review Meeting: TEM and high-resolution AES mapping data on CIGS samples.

AB - Presented at 2001 NCPV Program Review Meeting: TEM and high-resolution AES mapping data on CIGS samples.

KW - aes mapping

KW - NCPV

KW - photovoltaics (PV)

KW - PV

KW - TEM

KW - thin films

M3 - Paper

T2 - NCPV Program Review Meeting

Y2 - 14 October 2001 through 17 October 2001

ER -