High Speed Characterization of Photovoltaic Devices

R. K. Ahrenkiel, D. J. Dunlavy, H. C. Hamaker

Research output: Contribution to journalArticlepeer-review

4 Scopus Citations


Two high speed techniques are described for characterizing minority carrier transport coefficients in photovoltaic devices. These techniques are photoluminescence lifetime and diffusion time of flight (TOF). Current theories of bulk recombination processes are reviewed. The time-dependent continuity equation is solved for diffusion in an n-p homojunction. Experimental TOF data are compared with theory to obtain the transport coefficients of minority carrier lifetime, diffusivity and diffusion length. An analytical solution is developed for the quenching of photoluminescence lifetime by current collection in the junction. This solution is compared with experimental data.

Original languageAmerican English
Pages (from-to)353-369
Number of pages17
JournalSolar Cells
Issue number1-4
StatePublished - 1987

Bibliographical note

Work performed by Solar Energy Research Institute, Golden, Colorado, and Varian Research Center, Palo Alto, California

NREL Publication Number

  • ACNR/JA-213-7766


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