High-Speed Mapping of Grown-In Defects and Their Influence in Large-Area Silicon Photovoltaic Devices

Research output: Contribution to journal › Article › peer-review

NREL Publication Number

@article{61ffe1c2d9d649219f158d71896cfb8d,

title = "High-Speed Mapping of Grown-In Defects and Their Influence in Large-Area Silicon Photovoltaic Devices",

author = "NREL",

year = "2000",

doi = "10.1016/S0022-0248(99)00708-3",

language = "American English",

volume = "210",

pages = "346--350",

journal = "Journal of Crystal Growth",

issn = "0022-0248",

publisher = "Elsevier",

}