High-Speed Mapping of Grown-In Defects and Their Influence in Large-Area Silicon Photovoltaic Devices

Research output: Contribution to journalArticlepeer-review

Original languageAmerican English
Pages (from-to)346-350
Number of pages5
JournalJournal of Crystal Growth
Volume210
DOIs
StatePublished - 2000

NREL Publication Number

  • NREL/JA-520-26422

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