High Throughput, Noncontact System for Screening Silicon Wafers Predisposed to Breakage During Solar Cell Production

Research output: Contribution to conferencePaper

Original languageAmerican English
Pages001134-001139
Number of pages6
DOIs
StatePublished - 2011
Event37th IEEE Photovoltaic Specialists Conference (PVSC '11) - Seattle, Washington
Duration: 19 Jun 201124 Jun 2011

Conference

Conference37th IEEE Photovoltaic Specialists Conference (PVSC '11)
CitySeattle, Washington
Period19/06/1124/06/11

NREL Publication Number

  • NREL/AB-5200-50703

Keywords

  • silicon wafers
  • solar cell production
  • solar module fabrication

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