Hole Drift Mobility Measurements in Polycrystalline CuIn1-xGaxSe2

Rommel Noufi, W.N. Shafarman, S.A. Dinca, E.A. Schiff

    Research output: Contribution to journalArticlepeer-review

    Original languageAmerican English
    Number of pages12
    JournalPhysical Review B - Condensed Matter and Materials Physics
    Volume80
    Issue number23
    DOIs
    StatePublished - 2009

    NREL Publication Number

    • NREL/JA-520-47585

    Keywords

    • CIGS
    • hole drift
    • polycrystalline
    • solar
    • thin film

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