How Grain Boundaries in Cu(In,Ga)Se2 Thin Films are Charged: Revisit: Article No. 033903

Research output: Contribution to journalArticlepeer-review

Original languageAmerican English
Number of pages4
JournalApplied Physics Letters
Volume101
Issue number3
DOIs
StatePublished - 2012

NREL Publication Number

  • NREL/JA-5200-53638

Keywords

  • grain boundaries
  • Kevlin probe force microscopy
  • measurements
  • thin films

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