How Lifetime Fluctuations, Grain-Boundary Recombination, and Junctions Affect Lifetime Measurements and Their Correlation to Silicon Solar Cell Performance

Research output: Contribution to journalArticlepeer-review

Original languageAmerican English
Pages (from-to)1123-1135
Number of pages13
JournalSolar Energy Materials and Solar Cells
Volume92
DOIs
StatePublished - 2008

NREL Publication Number

  • NREL/JA-520-43769

Keywords

  • device modeling
  • grain boundary
  • photoconductivity
  • recombination lifetime
  • silicon

Cite this