How Lifetime Fluctuations, Grain-Boundary Recombination, and Junctions Affect Lifetime Measurements and Their Correlation to Silicon Solar Cell Performance

    Research output: Contribution to journalArticlepeer-review

    Original languageAmerican English
    Pages (from-to)1123-1135
    Number of pages13
    JournalSolar Energy Materials and Solar Cells
    Volume92
    DOIs
    StatePublished - 2008

    NREL Publication Number

    • NREL/JA-520-43769

    Keywords

    • device modeling
    • grain boundary
    • photoconductivity
    • recombination lifetime
    • silicon

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