Abstract
The investigation of the structural properties of hydrogenated microcrystalline silicon solar cells using Raman, X-ray diffraction and atomic force microscopy was discussed. A significant increase of microcrystalline volume fraction and grain size with increasing film thickness was shown. It was suggested that the increase of grain size and microcrystalline volume fraction with thickness was the main reason for the deterioration of cell performance as the intrinsic layer thickness increases. It was found that by varying the hydrogen dilution in the gas mixture during deposition, microstructure evolution has been controlled and cell performance significantly improved.
Original language | American English |
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Pages (from-to) | 1955-1957 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 85 |
Issue number | 11 |
DOIs | |
State | Published - 2004 |
NREL Publication Number
- NREL/JA-520-37465