Abstract
Electroluminescence and photoluminescence (EL and PL) are two imaging techniques employed at NREL that are used to qualitatively evaluate solar cells. In this work, imaging lab-scale CdTe and CIGS devices provides information about small-area PV response, which will aid in determining the effects of non-uniformities on cell performance. EL, PL, and dark lock-in thermography signatures are first catalogued. Their responses to varying conditions are then studied. Further analysis includes acquiring spectral data, making microscopy measurements, and correlating luminescence to device performance. The goal of this work is to quantitatively determine non-uniformity effects on cell performance using rapid imaging techniques.
Original language | American English |
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Pages | 1716-1720 |
Number of pages | 5 |
DOIs | |
State | Published - 2012 |
Event | 38th IEEE Photovoltaic Specialists Conference, PVSC 2012 - Austin, TX, United States Duration: 3 Jun 2012 → 8 Jun 2012 |
Conference
Conference | 38th IEEE Photovoltaic Specialists Conference, PVSC 2012 |
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Country/Territory | United States |
City | Austin, TX |
Period | 3/06/12 → 8/06/12 |
Bibliographical note
See CP-5200-54149 for preprintNREL Publication Number
- NREL/CP-5200-56916
Keywords
- electroluminescence
- imaging
- photoluminescence
- photovoltaic cells
- thin films