Abstract
Artificial intelligence (AI) holds immense promise for revolutionizing microscopy, yet its widespread adoption has been hindered by challenges ranging from user inexperience to limited model transferability and difficulties in operationalizing machine learning. This presentation showcases our approach to developing practical autonomy for materials discovery, aiming to accelerate the integration of AI into everyday microscopy workflows. As shown in Fig. 1, I will focus on three key areas: understanding order-disorder transitions, quantifying point defects, and achieving truly device-scale microscopy.
| Original language | American English |
|---|---|
| Number of pages | 2 |
| DOIs | |
| State | Published - 2025 |
| Event | Microscopy and Microanalysis 2025 - Salt Lake City, UT Duration: 27 Jul 2025 → 31 Jul 2025 |
Conference
| Conference | Microscopy and Microanalysis 2025 |
|---|---|
| City | Salt Lake City, UT |
| Period | 27/07/25 → 31/07/25 |
NLR Publication Number
- NLR/CP-5K00-93223
Keywords
- artificial intelligence
- automation
- electron microscopy
- machine learning
- materials science
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