Imaging Electron Transport Across Grain Boundaries in an Integrated Electron and Atomic Force Microscopy Platform: Application to Polycrystalline Silicon Solar Cells: Paper No. 1153-A15-03

Research output: Contribution to conferencePaper

Original languageAmerican English
Pages287-292
Number of pages6
StatePublished - 2009
EventAmorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2009: Materials Research Society Symposium - San Francisco, California
Duration: 14 Apr 200917 Apr 2009

Conference

ConferenceAmorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2009: Materials Research Society Symposium
CitySan Francisco, California
Period14/04/0917/04/09

NREL Publication Number

  • NREL/CP-520-45593

Keywords

  • grain boundaries
  • photovoltaic
  • scanning probe microscopy (SPM)

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