Imaging Electron Transport Across Grain Boundaries in an Integrated Electron and Atomic Force Microscopy Platform: Application to Polycrystalline Silicon Solar Cells: Paper No. 1153-A15-03

Imaging Electron Transport Across Grain Boundaries in an Integrated Electron and Atomic Force Microscopy Platform: Application to Polycrystalline Silicon Solar Cells: Paper No. 1153-A15-03

Research output: Contribution to conference › Paper

Original language	American English
Pages	287-292
Number of pages	6
State	Published - 2009
Event	Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2009: Materials Research Society Symposium - San Francisco, California Duration: 14 Apr 2009 → 17 Apr 2009

Conference

Conference	Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2009: Materials Research Society Symposium
City	San Francisco, California
Period	14/04/09 → 17/04/09

NREL Publication Number

NREL/CP-520-45593

Keywords

grain boundaries
photovoltaic
scanning probe microscopy (SPM)

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Cite this

NREL (2009). Imaging Electron Transport Across Grain Boundaries in an Integrated Electron and Atomic Force Microscopy Platform: Application to Polycrystalline Silicon Solar Cells: Paper No. 1153-A15-03. 287-292. Paper presented at Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2009: Materials Research Society Symposium, San Francisco, California.

@conference{e1ccf31344c84f4fb60df5ac5dbe642d,

title = "Imaging Electron Transport Across Grain Boundaries in an Integrated Electron and Atomic Force Microscopy Platform: Application to Polycrystalline Silicon Solar Cells: Paper No. 1153-A15-03",

keywords = "grain boundaries, photovoltaic, scanning probe microscopy (SPM)",

author = "NREL",

year = "2009",

language = "American English",

pages = "287--292",

note = "Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2009: Materials Research Society Symposium ; Conference date: 14-04-2009 Through 17-04-2009",

}

NREL 2009, 'Imaging Electron Transport Across Grain Boundaries in an Integrated Electron and Atomic Force Microscopy Platform: Application to Polycrystalline Silicon Solar Cells: Paper No. 1153-A15-03', Paper presented at Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2009: Materials Research Society Symposium, San Francisco, California, 14/04/09 - 17/04/09 pp. 287-292.

Imaging Electron Transport Across Grain Boundaries in an Integrated Electron and Atomic Force Microscopy Platform: Application to Polycrystalline Silicon Solar Cells: Paper No. 1153-A15-03. / NREL.
2009. 287-292 Paper presented at Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2009: Materials Research Society Symposium, San Francisco, California.

Research output: Contribution to conference › Paper

TY - CONF

T1 - Imaging Electron Transport Across Grain Boundaries in an Integrated Electron and Atomic Force Microscopy Platform: Application to Polycrystalline Silicon Solar Cells

T2 - Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2009: Materials Research Society Symposium

AU - NREL, null

PY - 2009

Y1 - 2009

KW - grain boundaries

KW - photovoltaic

KW - scanning probe microscopy (SPM)

M3 - Paper

SP - 287

EP - 292

Y2 - 14 April 2009 through 17 April 2009

ER -