Imaging Interfacial Layers and Internal Fields in Nanocrystalline Junctions

Engineering

• Atomic Force Microscopy 20%
• Band Bending 20%
• Conductive 20%
• Conductive Atomic Force Microscopy 20%
• Cross Section 20%
• Electronic State 20%
• Energetics 20%
• Energy Levels 20%
• External Quantum Efficiency 20%
• Heterojunctions 20%
• High Photon Energy 20%
• Hole Pair 20%
• Interfacial Layer 100%
• Internal Field 100%
• Nanocrystalline 100%
• Nanomaterial 40%
• Photovoltaics 20%
• Potential Difference 20%
• Power Conversion Efficiency 20%
• Quantum Dot 100%
• Smallest Feature 20%
• Solar Cell 80%
• Solar Spectra 20%
• Space Charge 20%
• Spatial Resolution 20%
• Thin Films 20%

Material Science

• Atomic Force Microscopy 40%
• Chalcogenides 20%
• Conductive Film 20%
• Device Efficiency 20%
• Electronic Property 20%
• Energy Levels 20%
• Film 20%
• Heterojunction 20%
• Interfacial Imaging 100%
• Microscopy 20%
• Nanocrystalline 100%
• Nanostructure 40%
• Photovoltaics 20%
• Quantum Dot 100%
• Scanning Kelvin Probe 40%
• Solar Cell 80%
• Thin Films 20%

Chemical Engineering

• Chalcogenides 33%
• Film 100%
• Nanostructure 66%