Imaging the Thickness of Passivation Layers for Crystalline Silicon with Micron-Scale Spatial Resolution Using Spectral Photoluminescence

Engineering

• Crystalline Silicon 100%
• Passivation Layer 100%
• Spatial Resolution 100%
• Solar Cell 100%
• Photovoltaics 50%
• Silicon Surface 50%
• Passivation 50%
• Nitride 50%
• Hydrogenated Amorphous Silicon 50%
• Solar Cell 50%
• Scale Feature 50%
• Thin Films 50%
• Silicon Wafer 50%
• Dynamic Range 50%

Material Science

• Silicon 100%
• Photoluminescence 100%
• Solar Cell 66%
• Film 66%
• Optical Property 33%
• Electronic Property 33%
• Amorphous Silicon 33%
• Photovoltaics 33%
• Silicon Nitride 33%
• Silicon Solar Cell 33%
• Silicon Wafer 33%
• Surface (Surface Science) 33%
• Thin Films 33%