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Impact of Accelerated StressTests on SiC MOSFET Precursor Parameters: Preprint
Douglas DeVoto
, Joshua Major
, Joseph Kozak
, Khai Ngo
Center for Integrated Mobility Sciences
Virginia Tech
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Dive into the research topics of 'Impact of Accelerated StressTests on SiC MOSFET Precursor Parameters: Preprint'. Together they form a unique fingerprint.
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Engineering
Metal-Oxide-Semiconductor Field-Effect Transistor
100%
Failure Mechanism
100%
Power Electronics
50%
Illustrates
50%
System Reliability
50%
Electronic Power Circuit
50%
Gate Bias
50%
Systems Performance
50%
Material Science
Metal-Oxide-Semiconductor Field-Effect Transistor
100%
Electronic Circuit
50%
Thermal Cycling
50%