Impact of Air Exposure on the Chemical and Electronic Structure of ZnO:Zn3N2 Thin Films

M. Bär, K. S. Ahn, S. Shet, Y. Yan, L. Weinhardt, O. Fuchs, M. Blum, S. Pookpanratana, K. George, W. Yang, J. D. Denlinger, M. Al-Jassim, C. Heske

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Abstract

The chemical and electronic surface structure of ZnO: Zn3 N2 (ZnO:N) thin films with different N contents was investigated by soft x-ray emission spectroscopy. Upon exposure to ambient air (in contrast to storage in vacuum), the chemical and electronic surface structure of the ZnO:N films changes substantially. In particular, we find that the Zn3 N2 (Zn3 N2 +ZnO) ratio decreases with exposure time and that this change depends on the initial N content. We suggest a degradation mechanism based on the reaction of the Zn3 N2 content with atmospheric humidity.

Original languageAmerican English
Article numberArticle No. 012110
Number of pages3
JournalApplied Physics Letters
Volume94
Issue number1
DOIs
StatePublished - 2009

NREL Publication Number

  • NREL/JA-520-45344

Keywords

  • materials science
  • thin films

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