Abstract
The chemical and electronic surface structure of ZnO: Zn3 N2 (ZnO:N) thin films with different N contents was investigated by soft x-ray emission spectroscopy. Upon exposure to ambient air (in contrast to storage in vacuum), the chemical and electronic surface structure of the ZnO:N films changes substantially. In particular, we find that the Zn3 N2 (Zn3 N2 +ZnO) ratio decreases with exposure time and that this change depends on the initial N content. We suggest a degradation mechanism based on the reaction of the Zn3 N2 content with atmospheric humidity.
Original language | American English |
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Article number | Article No. 012110 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 94 |
Issue number | 1 |
DOIs | |
State | Published - 2009 |
NREL Publication Number
- NREL/JA-520-45344
Keywords
- materials science
- thin films