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Impact of Dislocations on Minority Carrier Electron and Hole Lifetimes in GaAs Grown on Metamorphic SiGe Substrates
C. L. Andre, J. J. Boeckl, D. M. Wilt, A. J. Pitera, M. L. Lee, E. A. Fitzgerald, B. M. Keyes, S. A. Ringel
Research output: Contribution to journal › Article › peer-review
96
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