Abstract
Power loss caused by polarization-type potential-induced degradation (PID-p) in a variety of high-performance photovoltaic cell types has been observed to be recoverable via subsequent illumination and in some cases preventable via simultaneous illumination. In this report, we describe the results of a study in which the front faces of n-PERT cells encapsulated in polymers with a broad range of electrical resistivity were exposed to varying and controlled irradiance during PID testing. For a low resistivity ethylene-vinyl acetate copolymer encapsulant, no reduction in the rate or extent of power loss was observed for irradiance as high as 1,000 W/m2, whereas for high and intermediate resistivity polyolefin encapsulants, 100 and 300 W/m2, respectively, prevented power loss. We introduce a simple model based on charge accumulation that facilitates interpretation of these results whereby degradation via charge accumulation under voltage stress and recovery due to light exposure are opposing and interdependent phenomena that describe the susceptibility of a module to power loss.
Original language | American English |
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Pages (from-to) | 455-463 |
Number of pages | 9 |
Journal | Progress in Photovoltaics: Research and Applications |
Volume | 30 |
Issue number | 5 |
DOIs | |
State | Published - 2022 |
Bibliographical note
Publisher Copyright:© 2021 John Wiley & Sons, Ltd.
NREL Publication Number
- NREL/JA-5K00-80058
Keywords
- modules
- PERT
- PID
- potential-induced degradation
- reliability