Abstract
Using Sentaurus Device Software, we analyze how bulk and interface recombination affect time-resolved photoluminescence (TRPL) decays in CdTe solar cells. This modeling analysis could improve the interpretation of TRPL data and increase the possibility of rapid defect characterization in thin-film solar cells. By illuminating the samples with photons of two different wavelengths, we try to deducethe spatial origin of the dominant recombination loss. Shorter-wavelength photons will be more affected by the interface recombination and drift compared to the longer ones. Using the two-wavelength TRPL characterization method, it may be possible to determine whether a specific change in deposition process has affected the properties of interface or the bulk of the absorber.
| Original language | American English |
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| Number of pages | 8 |
| State | Published - 2012 |
| Event | 2012 IEEE Photovoltaic Specialists Conference - Austin, Texas Duration: 3 Jun 2012 → 8 Jun 2012 |
Conference
| Conference | 2012 IEEE Photovoltaic Specialists Conference |
|---|---|
| City | Austin, Texas |
| Period | 3/06/12 → 8/06/12 |
NLR Publication Number
- NREL/CP-5200-54116
Keywords
- carrier lifetime
- CdTe
- interface recombination
- numerical simulations