Impact of Interface Recombination on Time Resolved Photoluminescence Decays (TRPL) in CdTe Solar Cells (Numerical Simulation Analysis) (Poster)

Research output: NRELPoster

Abstract

Using Sentaurus Device Software, we analyze how bulk and interface recombination affect time-resolved photoluminescence (TRPL) decays in CdTe solar cells. This modeling analysis could improve the interpretation of TRPL data and increase the possibility of rapid defect characterization in thin-film solar cells. By illuminating the samples with photons of two different wavelengths, we try to deducethe spatial origin of the dominant recombination loss. Shorter-wavelength photons will be more affected by the interface recombination and drift compared to the longer ones. Using the two-wavelength TRPL characterization method, it may be possible to determine whether a specific change in deposition process has affected the properties of interface or the bulk of the absorber.
Original languageAmerican English
StatePublished - 2012

Publication series

NamePresented at the 38th IEEE Photovoltaic Specialists Conference, 3-8 June 2012, Austin, Texas

NREL Publication Number

  • NREL/PO-5200-55443

Keywords

  • carrier lifetime
  • CdTe
  • interface recombination
  • numerical simulations

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