Impact of Interface Recombination on Time Resolved Photoluminescence (TRPL) Decays in CdTe Solar Cells (Numerical Simulation Analysis)

Ana Kanevce, Darius Kuciauskas, Timothy A. Gessert, Dean H. Levi, David S. Albin

Research output: Contribution to conferencePaperpeer-review

26 Scopus Citations

Abstract

Using Sentaurus Device Software, we analyze how bulk and interface recombination affect time-resolved photoluminescence (TRPL) decays in CdTe solar cells. This modeling analysis could improve the interpretation of TRPL data and increase the possibility of rapid defect characterization in thin-film solar cells. By illuminating the samples with photons of two different wavelengths, we try to deduce the spatial origin of the dominant recombination loss. Shorter-wavelength photons will be more affected by the interface recombination and drift compared to the longer ones. Using the two-wavelength TRPL characterization method, it may be possible to determine whether a specific change in deposition process has affected the properties of interface or the bulk of the absorber.

Original languageAmerican English
Pages848-853
Number of pages6
DOIs
StatePublished - 2012
Event38th IEEE Photovoltaic Specialists Conference, PVSC 2012 - Austin, TX, United States
Duration: 3 Jun 20128 Jun 2012

Conference

Conference38th IEEE Photovoltaic Specialists Conference, PVSC 2012
Country/TerritoryUnited States
CityAustin, TX
Period3/06/128/06/12

Bibliographical note

See CP-5200-54116 for preprint

NREL Publication Number

  • NREL/CP-5200-56906

Keywords

  • carrier lifetime
  • CdTe
  • interface recombination
  • numerical simulations

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