Impact of Interface Trap Density at Metal/SiNx/n+ MOS Capacitor in Multilayered Si Solar Cells

Santosh Sahoo, Durga Misra, Nuggehalli Ravindra

Research output: Contribution to journalArticlepeer-review

Original languageAmerican English
Pages (from-to)101-105
Number of pages5
JournalEmerging Materials Research
Volume3
Issue number2
DOIs
StatePublished - 2013

NREL Publication Number

  • NREL/JA-5K00-63133

Cite this