Abstract
CdTe solar cells suffer from a non-ideal back contact which can strongly affect the equivalent circuit model and complicate capacitance measurements. Here, five different back contact materials are deposited on identical CdTe absorbers and their influence on capacitance measurements is characterized. A five-element equivalent circuit model is shown to represent a CdTe solar cell with a non-ideal back contact, and capacitance-frequency (C-f) measurements on each sample clearly show the influence of this contact. Capacitance-voltage (C-V) measurements on each sample show the influence of frequency on measured capacitance. In the AlGaOx/Au sample, temperature dependent C-fs show the back barrier height to be 240 meV, and ongoing measurements will give a comparison of back barrier heights for all samples. This study provides insight into the efficacy of various back contacts and highlights potential errors in the interpretation of capacitance measurements due to the presence of the back contact.
Original language | American English |
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Pages | 1644-1646 |
Number of pages | 3 |
DOIs | |
State | Published - 2024 |
Event | 2024 IEEE 52nd Photovoltaic Specialist Conference (PVSC) - Seattle, Washington Duration: 9 Jun 2024 → 14 Jun 2024 |
Conference
Conference | 2024 IEEE 52nd Photovoltaic Specialist Conference (PVSC) |
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City | Seattle, Washington |
Period | 9/06/24 → 14/06/24 |
NREL Publication Number
- NREL/CP-5K00-92705
Keywords
- cadmium compounds
- capacitance
- capacitance measurement
- capacitance-voltage characteristics
- equivalent circuits
- frequency measurement
- II-VI semiconductor materials
- integrated circuit modeling
- photovoltaic cells
- temperature measurement