Abstract
An extensive effort is being directed at the National Renewable Energy Laboratory (NREL) towards the development of polycrystalline CdTe solar cells. In adition to device properties, other characterization methods such as AEM, TEM and sputter depth profiling techniques are being used for microstructural and chemical characterization. Interface chemistry, grain growth, defect generation and phaseidentification are examples of some of the material properties being investigated. In this wrok, we discuss the development of sample preparation which reduces surface topography, and some subtle modifications to extablished TEM sample preparation techniques that enhance the quality and reliability of the analytical measurements obtained from this material.
| Original language | American English |
|---|---|
| Pages | 139-140 |
| Number of pages | 2 |
| State | Published - 1995 |
| Event | Annual Microbeam Analysis Society Conference - Breckenridge, Colorado Duration: 29 Aug 1995 → 29 Aug 1995 |
Conference
| Conference | Annual Microbeam Analysis Society Conference |
|---|---|
| City | Breckenridge, Colorado |
| Period | 29/08/95 → 29/08/95 |
NREL Publication Number
- NREL/CP-530-25340
