Impurity Precipitation, Dissolution, Gettering and Passivation in PV Silicon: Final Technical Report, 30 January 1998--29 August 2001

    Research output: NRELSubcontract Report

    Abstract

    This report describes the major progress in understanding the physics of transition metals in silicon and their possible impact on the efficiency of solar cells that was achieved during the three-year span of this subcontract. We found that metal-silicide precipitates and dissolved 3d transition metals can be relatively easily gettered. Gettering and passivating treatments must take into accountthe individuality of each transition metal. Our studies demonstrated how significant is the difference between defect reactions of copper and iron. Copper does not significantly affect the minority-carrier diffusion length in p-type silicon, at least as long as its concentration is low, but readily precipitates in n-type silicon. Therefore, copper precipitates may form in the area of p-njunctions and cause shunts in solar cells. Fortunately, copper precipitates are present mostly in the chemical state of copper-silicide and can relatively easily be dissolved. In contrast, iron was found to form clusters of iron-oxides and iron-silicates in the wafers. These clusters are thermodynamically stable even in high temperatures and are extremely difficult to remove. The formation ofiron-silicates was observed at temperatures over 900?C.
    Original languageAmerican English
    Number of pages89
    StatePublished - 2002

    Bibliographical note

    Work performed by University of California at Berkeley, Berkeley, California

    NREL Publication Number

    • NREL/SR-520-31528

    Keywords

    • 3d transition
    • beam induced current
    • gettering
    • metal silicide precipitates
    • minority-carrier diffusion
    • multicrystalline silicon
    • P-N junctions
    • p-Type
    • passivation
    • PV
    • recombination activity
    • transient ion drift (TID)
    • x-ray fluorescence microprobe analyses

    Fingerprint

    Dive into the research topics of 'Impurity Precipitation, Dissolution, Gettering and Passivation in PV Silicon: Final Technical Report, 30 January 1998--29 August 2001'. Together they form a unique fingerprint.

    Cite this