In-Situ Characterization of Potential-Induced Degradation in Crystalline Silicon Photovoltaic Modules Through Dark I-V Measurements

Peter Hacke, Wei Luo, Jai Singh, Jing Chai, Yan Wang, Seeram Ramakrishna, Armin Aberle, Yong Khoo

Research output: Contribution to journalArticlepeer-review

22 Scopus Citations

Abstract

A temperature correction methodology for in-situ dark I-V (DIV) characterization of conventional p-Type crystalline silicon photovoltaic (PV) modules undergoing potential-induced degradation (PID) is proposed. We observe that the DIV-derived module power temperature coefficient (γdark ) varies as a function of the extent of PID. To investigate the relationship between γdark and DIV-derived module power (Pdark (Ts), measured in situ and at the stress temperature) two parameters are defined: change in the DIV-derived module temperature coefficient (δγdark ) and DIV-derived module power degradation at the PID stress temperature (δPdark (Ts)). It is determined that there is a linear relationship betweenδγdark andδPdark (Ts). Based on this finding, we can easily determine the module γdark at various stages of PID by monitoring Pdark (Ts) in situ. We then further develop a mathematical model to translate Pdark (Ts) to that at 25 °C (Pdark (25 °C)), which is correlated with the module power measured at the standard testing conditions (PSTC ). Our experiments demonstrate that, for various degrees of PID, the temperature correction methodology offers a relative accuracy of ±3% for predicting PSTC . Furthermore, it reduces the root-mean-square error (RMSE) by around 70%, compared with the PSTC estimation without the temperature correction.

Original languageAmerican English
Article number7742987
Pages (from-to)104-109
Number of pages6
JournalIEEE Journal of Photovoltaics
Volume7
Issue number1
DOIs
StatePublished - Jan 2017

Bibliographical note

Publisher Copyright:
© 2011-2012 IEEE.

NREL Publication Number

  • NREL/JA-5J00-67339

Keywords

  • In-situ dark I-V (DIV) characterization
  • module power temperature coefficient
  • photovoltaic (PV) modules
  • potential-induced degradation (PID)
  • temperature correction.

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