Abstract
In this work we investigate degradation rates of triplecation mixed-halide perovskite p-i-n solar cells. We present an accelerated stress testing procedure using periodic blue light-soaking at elevated temperatures until devices reach ~80% of their initial efficiency. We track light-induced degradation via in-situ: photoluminescence (PL), current-voltage (I-V) curves, and transient photovoltage. Devices underwent 165 hours of light bias at 65degrees C. Results suggest that spatial uniformity in PL intensity decreases as device degradation increases. This investigation lays the groundwork to address the current gap in understanding the interplay between device performance and the evolution of macroscopic features in perovskite solar cells. Thus, we believe spatial characterization techniques will play a crucial role in the commercialization of perovskite solar cells.
Original language | American English |
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Pages | 1591-1593 |
Number of pages | 3 |
DOIs | |
State | Published - 2024 |
Event | 2024 IEEE 52nd Photovoltaic Specialist Conference (PVSC) - Seattle, Washington Duration: 9 Jun 2024 → 14 Jun 2024 |
Conference
Conference | 2024 IEEE 52nd Photovoltaic Specialist Conference (PVSC) |
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City | Seattle, Washington |
Period | 9/06/24 → 14/06/24 |
NREL Publication Number
- NREL/CP-5K00-92676
Keywords
- imaging
- perovskite
- photoluminescence
- reliability