In-Situ Measurements of Cu(In,Ga)Se2 Composition by X-Ray Fluorescence

I. L. Eisgruber; R. E. Treece; R. E. Hollingsworth; J. R. Engel; J. Britt

doi:10.1109/PVSC.2000.915882

In-Situ Measurements of Cu(In,Ga)Se2 Composition by X-Ray Fluorescence

I. L. Eisgruber, R. E. Treece, R. E. Hollingsworth, J. R. Engel, J. Britt

Research output: Contribution to conference › Paper › peer-review

4 Scopus Citations

Abstract

Yield and reproducibility issues remain an important challenge in Cu(In,Ga)Se2 (CIGS) photovoltaic module fabrication. Development of sensors for processing is therefore an important step towards realizing the potential of CIGS modules for cheap, large-scale power production. In-situ x-ray fluorescence (XRF) has been developed by the authors to monitor composition and thickness of CIGS layers in real time. In-situ operation to date indicates that the sensor is a useful indicator of these properties. This paper describes advances in a number of areas that are necessary for in-situ composition measurements: design of the sensor equipment, analysis of the x-ray signals, and protection of the sensor in the Se environment. Results from in-situ operation are presented.

Original language	American English
Pages	505-508
Number of pages	4
DOIs	https://doi.org/10.1109/PVSC.2000.915882
State	Published - 2000
Externally published	Yes
Event	28th IEEE Photovoltaic Specialists Conference, PVSC 2000 - Anchorage, United States Duration: 15 Sep 2000 → 22 Sep 2000

Conference

Conference	28th IEEE Photovoltaic Specialists Conference, PVSC 2000
Country/Territory	United States
City	Anchorage
Period	15/09/00 → 22/09/00

Bibliographical note

Work performed by ITN Energy Systems, Wheat Ridge, Colorado; Materials Research Group, Inc., Wheat Ridge, Colorado; and Global Solar Energy, LLC, Tucson, Arizona

NREL Publication Number

NREL/CP-520-30325

Access to Document

10.1109/PVSC.2000.915882

Cite this

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title = "In-Situ Measurements of Cu(In,Ga)Se2 Composition by X-Ray Fluorescence",

abstract = "Yield and reproducibility issues remain an important challenge in Cu(In,Ga)Se2 (CIGS) photovoltaic module fabrication. Development of sensors for processing is therefore an important step towards realizing the potential of CIGS modules for cheap, large-scale power production. In-situ x-ray fluorescence (XRF) has been developed by the authors to monitor composition and thickness of CIGS layers in real time. In-situ operation to date indicates that the sensor is a useful indicator of these properties. This paper describes advances in a number of areas that are necessary for in-situ composition measurements: design of the sensor equipment, analysis of the x-ray signals, and protection of the sensor in the Se environment. Results from in-situ operation are presented.",

author = "Eisgruber, {I. L.} and Treece, {R. E.} and Hollingsworth, {R. E.} and Engel, {J. R.} and J. Britt",

note = "Work performed by ITN Energy Systems, Wheat Ridge, Colorado; Materials Research Group, Inc., Wheat Ridge, Colorado; and Global Solar Energy, LLC, Tucson, Arizona; 28th IEEE Photovoltaic Specialists Conference, PVSC 2000 ; Conference date: 15-09-2000 Through 22-09-2000",

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doi = "10.1109/PVSC.2000.915882",

language = "American English",

pages = "505--508",

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AU - Eisgruber, I. L.

AU - Treece, R. E.

AU - Hollingsworth, R. E.

AU - Engel, J. R.

AU - Britt, J.

N1 - Work performed by ITN Energy Systems, Wheat Ridge, Colorado; Materials Research Group, Inc., Wheat Ridge, Colorado; and Global Solar Energy, LLC, Tucson, Arizona

PY - 2000

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N2 - Yield and reproducibility issues remain an important challenge in Cu(In,Ga)Se2 (CIGS) photovoltaic module fabrication. Development of sensors for processing is therefore an important step towards realizing the potential of CIGS modules for cheap, large-scale power production. In-situ x-ray fluorescence (XRF) has been developed by the authors to monitor composition and thickness of CIGS layers in real time. In-situ operation to date indicates that the sensor is a useful indicator of these properties. This paper describes advances in a number of areas that are necessary for in-situ composition measurements: design of the sensor equipment, analysis of the x-ray signals, and protection of the sensor in the Se environment. Results from in-situ operation are presented.

AB - Yield and reproducibility issues remain an important challenge in Cu(In,Ga)Se2 (CIGS) photovoltaic module fabrication. Development of sensors for processing is therefore an important step towards realizing the potential of CIGS modules for cheap, large-scale power production. In-situ x-ray fluorescence (XRF) has been developed by the authors to monitor composition and thickness of CIGS layers in real time. In-situ operation to date indicates that the sensor is a useful indicator of these properties. This paper describes advances in a number of areas that are necessary for in-situ composition measurements: design of the sensor equipment, analysis of the x-ray signals, and protection of the sensor in the Se environment. Results from in-situ operation are presented.

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T2 - 28th IEEE Photovoltaic Specialists Conference, PVSC 2000

Y2 - 15 September 2000 through 22 September 2000

ER -

In-Situ Measurements of Cu(In,Ga)Se2 Composition by X-Ray Fluorescence

Abstract

Conference

Bibliographical note

NREL Publication Number

Access to Document

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