In-Situ Measurements of Cu(In,Ga)Se2 Composition by X-Ray Fluorescence

I. L. Eisgruber, R. E. Treece, R. E. Hollingsworth, J. R. Engel, J. Britt

Research output: Contribution to conferencePaperpeer-review

4 Scopus Citations


Yield and reproducibility issues remain an important challenge in Cu(In,Ga)Se2 (CIGS) photovoltaic module fabrication. Development of sensors for processing is therefore an important step towards realizing the potential of CIGS modules for cheap, large-scale power production. In-situ x-ray fluorescence (XRF) has been developed by the authors to monitor composition and thickness of CIGS layers in real time. In-situ operation to date indicates that the sensor is a useful indicator of these properties. This paper describes advances in a number of areas that are necessary for in-situ composition measurements: design of the sensor equipment, analysis of the x-ray signals, and protection of the sensor in the Se environment. Results from in-situ operation are presented.

Original languageAmerican English
Number of pages4
StatePublished - 2000
Externally publishedYes
Event28th IEEE Photovoltaic Specialists Conference, PVSC 2000 - Anchorage, United States
Duration: 15 Sep 200022 Sep 2000


Conference28th IEEE Photovoltaic Specialists Conference, PVSC 2000
Country/TerritoryUnited States

Bibliographical note

Work performed by ITN Energy Systems, Wheat Ridge, Colorado; Materials Research Group, Inc., Wheat Ridge, Colorado; and Global Solar Energy, LLC, Tucson, Arizona

NREL Publication Number

  • NREL/CP-520-30325


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