In-situ Microscopy Characterization of Cu(In,Ga)Se2 Potential-Induced Degradation

Research output: Contribution to conferencePaperpeer-review

6 Scopus Citations


We report on the role of sodium in potentialinduced degradation (PID) of Cu(In, Ga)Se2 (CIGS) solar cells. In-situ microscopy characterizations on AFM platform were performed on two stressed CIGS device under room temperature (RT) and high temperature (HT) at 85 °C. During PID stressing we observed depletion region gets wider as Na migrates, p-n junction becomes leaky at RT for over a month; and similar junction evolution was observed for HT-stressed sample, eventually the junction collapsed after 18 hours. The diode behaviors were confirmed by dark I-V measurement. Time-of Flight secondary-ion mass spectrometry reveals that the Na accumulates on ZnO and CdS side, as well as the upper layer of CIGS layer. The results indicate that Na drifted by the voltage applied on the soda-lime glass, then diffuse through the whole device. And the sodium profiles have different points of evolution due to the temperature differences between the two stressed samples. The consistent results unambiguously show how Na from substrate glass causes PID in CIGS solar cells.

Original languageAmerican English
Number of pages4
StatePublished - Jun 2019
Event46th IEEE Photovoltaic Specialists Conference, PVSC 2019 - Chicago, United States
Duration: 16 Jun 201921 Jun 2019


Conference46th IEEE Photovoltaic Specialists Conference, PVSC 2019
Country/TerritoryUnited States

Bibliographical note

See NREL/CP-5K00-73121 for preprint

NREL Publication Number

  • NREL/CP-5K00-76350


  • CIGS
  • in-situ microscopy
  • p-n junction
  • PID
  • sodium


Dive into the research topics of 'In-situ Microscopy Characterization of Cu(In,Ga)Se2 Potential-Induced Degradation'. Together they form a unique fingerprint.

Cite this