In Situ Thickness Measurements of Chemical Bath Deposited CdS

J. R. Mann; N. Vora; I. L. Repins

doi:10.1016/j.solmat.2009.10.009

In Situ Thickness Measurements of Chemical Bath Deposited CdS

J. R. Mann, N. Vora, I. L. Repins

Materials, Chemical, and Computational Science

National Renewable Energy Laboratory

Research output: Contribution to journal › Article › peer-review

19 Scopus Citations

Abstract

Chemical bath-deposited (CBD) cadmium sulfide has been a component in some of the most efficient Cu(In,Ga)Se₂-based solar cell devices. While accurate in situ measurements of the thicknesses of vacuum-based depositions can be accomplished with quartz crystal monitors, solution-based growth rates of CdS vary greatly on different substrates and are therefore difficult to measure. This work discusses the effectiveness of using an optical reflectance-based measurement of the growing film to determine the film's thickness. On specular molybdenum films the measurement is accurate, while on the rough, poorly reflecting Cu(In,Ga)Se₂ (CIGS) films, the measurement is hampered.

Original language	American English
Pages (from-to)	333-337
Number of pages	5
Journal	Solar Energy Materials and Solar Cells
Volume	94
Issue number	2
DOIs	https://doi.org/10.1016/j.solmat.2009.10.009 https://doi.org/10.1016/j.solmat.2009.10.009
State	Published - 2010

NREL Publication Number

NREL/JA-520-46322

Keywords

Cadmium sulfide
CIGS
Interference measurement
Sensor
Thickness

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title = "In Situ Thickness Measurements of Chemical Bath Deposited CdS",

abstract = "Chemical bath-deposited (CBD) cadmium sulfide has been a component in some of the most efficient Cu(In,Ga)Se2-based solar cell devices. While accurate in situ measurements of the thicknesses of vacuum-based depositions can be accomplished with quartz crystal monitors, solution-based growth rates of CdS vary greatly on different substrates and are therefore difficult to measure. This work discusses the effectiveness of using an optical reflectance-based measurement of the growing film to determine the film's thickness. On specular molybdenum films the measurement is accurate, while on the rough, poorly reflecting Cu(In,Ga)Se2 (CIGS) films, the measurement is hampered.",

keywords = "Cadmium sulfide, CIGS, Interference measurement, Sensor, Thickness",

author = "Mann, {J. R.} and N. Vora and Repins, {I. L.}",

year = "2010",

doi = "10.1016/j.solmat.2009.10.009",

language = "American English",

volume = "94",

pages = "333--337",

journal = "Solar Energy Materials and Solar Cells",

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T1 - In Situ Thickness Measurements of Chemical Bath Deposited CdS

AU - Mann, J. R.

AU - Vora, N.

AU - Repins, I. L.

PY - 2010

Y1 - 2010

N2 - Chemical bath-deposited (CBD) cadmium sulfide has been a component in some of the most efficient Cu(In,Ga)Se2-based solar cell devices. While accurate in situ measurements of the thicknesses of vacuum-based depositions can be accomplished with quartz crystal monitors, solution-based growth rates of CdS vary greatly on different substrates and are therefore difficult to measure. This work discusses the effectiveness of using an optical reflectance-based measurement of the growing film to determine the film's thickness. On specular molybdenum films the measurement is accurate, while on the rough, poorly reflecting Cu(In,Ga)Se2 (CIGS) films, the measurement is hampered.

AB - Chemical bath-deposited (CBD) cadmium sulfide has been a component in some of the most efficient Cu(In,Ga)Se2-based solar cell devices. While accurate in situ measurements of the thicknesses of vacuum-based depositions can be accomplished with quartz crystal monitors, solution-based growth rates of CdS vary greatly on different substrates and are therefore difficult to measure. This work discusses the effectiveness of using an optical reflectance-based measurement of the growing film to determine the film's thickness. On specular molybdenum films the measurement is accurate, while on the rough, poorly reflecting Cu(In,Ga)Se2 (CIGS) films, the measurement is hampered.

KW - Cadmium sulfide

KW - CIGS

KW - Interference measurement

KW - Sensor

KW - Thickness

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DO - 10.1016/j.solmat.2009.10.009

M3 - Article

AN - SCOPUS:72149118438

SN - 0927-0248

VL - 94

SP - 333

EP - 337

JO - Solar Energy Materials and Solar Cells

JF - Solar Energy Materials and Solar Cells

IS - 2

ER -

In Situ Thickness Measurements of Chemical Bath Deposited CdS

Abstract

NREL Publication Number

Keywords

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