Abstract
The analytical drift-diffusion formalism is able to accurately simulate a wide range of solar cell architectures and was recently extended to include those with back surface reflectors. However, as solar cells approach the limits of material quality, photon recycling effects become increasingly important in predicting the behavior of these cells. In particular, the minority carrier diffusion length is significantly affected by the photon recycling, with consequences for the solar cell performance. In this paper, we outline an approach to account for photon recycling in the analytical Hovel model and compare analytical model predictions to GaAs-based experimental devices operating close to the fundamental efficiency limit.
Original language | American English |
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Article number | Article No. 194504 |
Number of pages | 10 |
Journal | Journal of Applied Physics |
Volume | 116 |
Issue number | 19 |
DOIs | |
State | Published - 21 Nov 2014 |
Bibliographical note
Publisher Copyright:© 2014 AIP Publishing LLC.
NREL Publication Number
- NREL/JA-5J00-63090