Influence of MBE Growth Conditions on Dislocation Densities of GaAs/Ge Epilayers Grown on Silicon Substrates

Research output: Contribution to conference › Paper

Original language	American English
Pages	364-365
Number of pages	2
State	Published - 1985
Event	43rd Annual Meeting of the Electron Microscopy Society of America - Louisville, Kentucky Duration: 5 Aug 1985 → 9 Aug 1985

Conference	43rd Annual Meeting of the Electron Microscopy Society of America
City	Louisville, Kentucky
Period	5/08/85 → 9/08/85

NREL Publication Number

@conference{8b0dfa525ab343628ac94a55f48defc8,

title = "Influence of MBE Growth Conditions on Dislocation Densities of GaAs/Ge Epilayers Grown on Silicon Substrates",

author = "NREL",

year = "1985",

language = "American English",

pages = "364--365",

note = "43rd Annual Meeting of the Electron Microscopy Society of America ; Conference date: 05-08-1985 Through 09-08-1985",

}