Abstract
Cadmium telluride thin films have been deposited on glass and glass/SnO2/CdS substrates using the stacked elemental layer (SEL) technique. After the films were deposited, they were subjected to the conventional heat treatment in the presence of a CdCl2/methanol solution. The samples were analyzed, before and after treatment, by X-ray diffraction, atomic force microscopy, cathodoluminescence and energy dispersive X-ray spectrometry. The results suggest that the treatment promotes grain growth, decreases defect concentration, and gives rise to the formation of a CdTe1-xSx solid solution, which replaces the CdTe original layer. The existence of this solid solution was evidenced by a reduction in the lattice parameter relative to untreated samples and confirmed by EDS analysis of treated and untreated glass/SnO2/CdS/CdTe structures.
| Original language | American English |
|---|---|
| Pages (from-to) | 44-48 |
| Number of pages | 5 |
| Journal | Thin Solid Films |
| Volume | 350 |
| Issue number | 1 |
| DOIs | |
| State | Published - 1999 |
NLR Publication Number
- NREL/JA-520-27232
Fingerprint
Dive into the research topics of 'Influence of Post-Deposition Treatment on the Physical Properties of CdTe Films Deposited by Stacked Elemental Layer Processing'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver