Influence of Surface Roughness on the Accuracy of Dislocation Density Mapping by PVSCAN

Research output: Contribution to conference › Paper

Original language	American English
Pages	237-243
Number of pages	7
State	Published - 2006
Event	15th Workshop on Crystalline Silicon Solar Cells and Modules: Materials and Processes - Denver, Colorado Duration: 6 Aug 2006 → 9 Aug 2006

Conference	15th Workshop on Crystalline Silicon Solar Cells and Modules: Materials and Processes
City	Denver, Colorado
Period	6/08/06 → 9/08/06

NREL Publication Number

@conference{46a2dc291ef44542ae58b12b862072c2,

title = "Influence of Surface Roughness on the Accuracy of Dislocation Density Mapping by PVSCAN",

author = "Przemyslaw Rupnowski",

year = "2006",

language = "American English",

pages = "237--243",

note = "15th Workshop on Crystalline Silicon Solar Cells and Modules: Materials and Processes ; Conference date: 06-08-2006 Through 09-08-2006",

}