Infrared Characterization of SrTiO3 Thin Films Using Attenuated Total Reflectance

    Research output: Contribution to journalArticle


    Attenuated Total Reflectance was used to measure the phonon vibration frequencies over the range 425-800 cm-1 of SrTiO3 thin films deposited either directly on LaAIO3, or on YBCO-coated LaAIOs single crystal substrates. In the s-polarized spectra, the transverse optic Ti-O stretching vibration shifted to lower frequencies as the film thickness increased, which was attributed to damping caused bythe generation of lower frequency phonon modes. The transverse Ti-O stretching vibration was also observed in the p-polarized spectra, but was more heavily damped, which indicates the damping is more pronounced when the electric field has component perpendicular to the film surface. Damping of the transverse modes was attributed to coupling of these modes to other phonon modes, and may be asource of the high losses at microwave frequencies.
    Original languageAmerican English
    Pages (from-to)1628-1631
    Number of pages4
    JournalIEEE Transactions on Applied Superconductivity
    Issue number2
    StatePublished - 1997

    NREL Publication Number

    • NREL/JA-520-24393


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