Infrared Spectroscopic, X-ray and Nanoscale Characterization of Strontium Titanate Thin Films

J. D. Webb; H. R. Moutinho; L. L. Kazmerski; C. H. Mueller; T. V. Rivkin; R. E. Treece; M. Dalberth; C. T. Rogers

doi:10.1080/10584589708015692

Infrared Spectroscopic, X-ray and Nanoscale Characterization of Strontium Titanate Thin Films

J. D. Webb, H. R. Moutinho, L. L. Kazmerski, C. H. Mueller, T. V. Rivkin, R. E. Treece, M. Dalberth, C. T. Rogers

Materials Science

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Abstract

Attenuated total reflectance (ATR) measurements were performed using Fourier transform infrared (FTIR) spectroscopy in the ATR mode with a thallium iodobromide (KRS-5) crystal to measure the frequencies of the v3 and v4 phonon absorption bands in thin strontium titanate films deposited on single-crystal yttrium-barium copper oxide (YBCO), lanthanum aluminate, magnesium oxide, and strontium titanate substrates. The KRS-5 crystal enabled FTIR-ATR measurements to be made at frequencies above 400 cm^-1. Atomic force microscopy (AFM) and X-ray diffraction (XRD) measurements were also made to further characterize the films. The measurements were repeated on single-crystal specimens of strontium titanate and the substrates for comparison. Softening in the frequency of the v4 transverse optical phonon in the lattice-mismatched films below the established value of 544 cm^-1 is indicative of the highly textured, polycrystalline ceramic nature of the films and is consistent with the XRD and AFM results.

Original language	American English
Pages (from-to)	9-18
Number of pages	10
Journal	Integrated Ferroelectrics
Volume	15
Issue number	1-4
DOIs	https://doi.org/10.1080/10584589708015692 https://doi.org/10.1080/10584589708015692
State	Published - 1997

NREL Publication Number

NREL/JA-530-23882

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@article{a179864727e4445b88fc60b54f757693,

title = "Infrared Spectroscopic, X-ray and Nanoscale Characterization of Strontium Titanate Thin Films",

abstract = "Attenuated total reflectance (ATR) measurements were performed using Fourier transform infrared (FTIR) spectroscopy in the ATR mode with a thallium iodobromide (KRS-5) crystal to measure the frequencies of the v3 and v4 phonon absorption bands in thin strontium titanate films deposited on single-crystal yttrium-barium copper oxide (YBCO), lanthanum aluminate, magnesium oxide, and strontium titanate substrates. The KRS-5 crystal enabled FTIR-ATR measurements to be made at frequencies above 400 cm-1. Atomic force microscopy (AFM) and X-ray diffraction (XRD) measurements were also made to further characterize the films. The measurements were repeated on single-crystal specimens of strontium titanate and the substrates for comparison. Softening in the frequency of the v4 transverse optical phonon in the lattice-mismatched films below the established value of 544 cm-1 is indicative of the highly textured, polycrystalline ceramic nature of the films and is consistent with the XRD and AFM results.",

author = "Webb, {J. D.} and Moutinho, {H. R.} and Kazmerski, {L. L.} and Mueller, {C. H.} and Rivkin, {T. V.} and Treece, {R. E.} and M. Dalberth and Rogers, {C. T.}",

year = "1997",

doi = "10.1080/10584589708015692",

language = "American English",

volume = "15",

pages = "9--18",

journal = "Integrated Ferroelectrics",

issn = "1058-4587",

publisher = "Taylor and Francis Ltd.",

number = "1-4",

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T1 - Infrared Spectroscopic, X-ray and Nanoscale Characterization of Strontium Titanate Thin Films

AU - Webb, J. D.

AU - Moutinho, H. R.

AU - Kazmerski, L. L.

AU - Mueller, C. H.

AU - Rivkin, T. V.

AU - Treece, R. E.

AU - Dalberth, M.

AU - Rogers, C. T.

PY - 1997

Y1 - 1997

N2 - Attenuated total reflectance (ATR) measurements were performed using Fourier transform infrared (FTIR) spectroscopy in the ATR mode with a thallium iodobromide (KRS-5) crystal to measure the frequencies of the v3 and v4 phonon absorption bands in thin strontium titanate films deposited on single-crystal yttrium-barium copper oxide (YBCO), lanthanum aluminate, magnesium oxide, and strontium titanate substrates. The KRS-5 crystal enabled FTIR-ATR measurements to be made at frequencies above 400 cm-1. Atomic force microscopy (AFM) and X-ray diffraction (XRD) measurements were also made to further characterize the films. The measurements were repeated on single-crystal specimens of strontium titanate and the substrates for comparison. Softening in the frequency of the v4 transverse optical phonon in the lattice-mismatched films below the established value of 544 cm-1 is indicative of the highly textured, polycrystalline ceramic nature of the films and is consistent with the XRD and AFM results.

AB - Attenuated total reflectance (ATR) measurements were performed using Fourier transform infrared (FTIR) spectroscopy in the ATR mode with a thallium iodobromide (KRS-5) crystal to measure the frequencies of the v3 and v4 phonon absorption bands in thin strontium titanate films deposited on single-crystal yttrium-barium copper oxide (YBCO), lanthanum aluminate, magnesium oxide, and strontium titanate substrates. The KRS-5 crystal enabled FTIR-ATR measurements to be made at frequencies above 400 cm-1. Atomic force microscopy (AFM) and X-ray diffraction (XRD) measurements were also made to further characterize the films. The measurements were repeated on single-crystal specimens of strontium titanate and the substrates for comparison. Softening in the frequency of the v4 transverse optical phonon in the lattice-mismatched films below the established value of 544 cm-1 is indicative of the highly textured, polycrystalline ceramic nature of the films and is consistent with the XRD and AFM results.

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DO - 10.1080/10584589708015692

M3 - Article

AN - SCOPUS:7044260801

SN - 1058-4587

VL - 15

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EP - 18

JO - Integrated Ferroelectrics

JF - Integrated Ferroelectrics

IS - 1-4

ER -

Infrared Spectroscopic, X-ray and Nanoscale Characterization of Strontium Titanate Thin Films

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