Injection-Level Spectroscopy of Metal Impurities in Silicon

    Research output: Contribution to conference › Paper

    Original languageAmerican English
    Pages575-581
    Number of pages7
    StatePublished - 1998
    EventDefect and Impurity Engineered Semiconductors II: Materials Research Society Symposium - San Francisco, California
    Duration: 13 Apr 1998 → 17 Apr 1998

    Conference

    ConferenceDefect and Impurity Engineered Semiconductors II: Materials Research Society Symposium
    CitySan Francisco, California
    Period13/04/98 → 17/04/98

    NLR Publication Number

    • NREL/CP-520-24605

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