Innovative Characterization of Amorphous and Thin-Film Silicon for Improved Module Performance: 1 February 2005 - 31 July 2008

    Research output: NRELSubcontract Report

    Abstract

    Electron spin resonance and nuclear magnetic resonance was done on amorphous silicon samples (modules with a-Si:H and a-SixGe1-x:H intrinsic layer) to study defects that contribute to Staebler-Wronski effect.
    Original languageAmerican English
    Number of pages44
    StatePublished - 2009

    Bibliographical note

    Work performed by University of Utah, Salt Lake City, Utah

    NREL Publication Number

    • NREL/SR-520-46649

    Keywords

    • amorphous
    • electronic spin resonance
    • innovative characterization
    • module performance
    • nuclear magnetic
    • PV
    • Satebler-Wronski effect
    • silicon
    • thin films

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