Innovative Characterization of Amorphous and Thin-Film Silicon for Improved Module Performance: 1 February 2005 - 31 July 2008

Research output: NRELSubcontract Report

Abstract

Electron spin resonance and nuclear magnetic resonance was done on amorphous silicon samples (modules with a-Si:H and a-SixGe1-x:H intrinsic layer) to study defects that contribute to Staebler-Wronski effect.
Original languageAmerican English
Number of pages44
StatePublished - 2009

Bibliographical note

Work performed by University of Utah, Salt Lake City, Utah

NREL Publication Number

  • NREL/SR-520-46649

Keywords

  • amorphous
  • electronic spin resonance
  • innovative characterization
  • module performance
  • nuclear magnetic
  • PV
  • Satebler-Wronski effect
  • silicon
  • thin films

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