Abstract
Electron spin resonance and nuclear magnetic resonance was done on amorphous silicon samples (modules with a-Si:H and a-SixGe1-x:H intrinsic layer) to study defects that contribute to Staebler-Wronski effect.
Original language | American English |
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Number of pages | 44 |
State | Published - 2009 |
Bibliographical note
Work performed by University of Utah, Salt Lake City, UtahNREL Publication Number
- NREL/SR-520-46649
Keywords
- amorphous
- electronic spin resonance
- innovative characterization
- module performance
- nuclear magnetic
- PV
- Satebler-Wronski effect
- silicon
- thin films